使用I/sub DDQ/测试的基于聚类的故障ic识别

Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat. No.98EX232) Pub Date : 1998-11-12 DOI:10.1109/IDDQ.1998.730756

S. Jandhyala, H. Balachandran, S. Menon, A. Jayasumana

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引用次数: 6

摘要

设计和工艺的技术进步导致了对I/sub DDQ/测试适用性的质疑。主要问题是无法区分ic中的正常和故障静态电流。在本文中，我们提出了一种新的方法，旨在通过应用聚类技术来识别具有异常I/sub DDQ/值的ic，从而解决这一问题。并介绍了该技术在生产试验中的初步应用结果。

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Clustering based identification of faulty ICs using I/sub DDQ/ tests

Technological advances in design and process have led to questions being raised about the applicability of I/sub DDQ/ testing. The main concern is the inability to differentiate between normal and faulty quiescent currents in ICs. In this paper, we propose a new methodology aimed at addressing this concern through the application of clustering techniques to identify ICs with abnormal I/sub DDQ/ values. Preliminary results of applying this technique in production test are also presented.

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来源期刊

Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat. No.98EX232)

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