{"title":"高效非准静态mosfet电路仿真模型","authors":"E. Dubois, E. Robilliart","doi":"10.1109/IEDM.1995.499372","DOIUrl":null,"url":null,"abstract":"A fast numerical resolution of the Poisson and current continuity equations is used to model non-quasi-static effects in MOS circuits under fast switching conditions. The resulting model is continuous over all regimes of operation and accounts for the non-instantaneous redistribution of the channel charge. The capabilities of this modelling approach are exemplified through the simulation of current mode analog circuits.","PeriodicalId":137564,"journal":{"name":"Proceedings of International Electron Devices Meeting","volume":"93 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Efficient non-quasi-static MOSFETs model for circuit simulation\",\"authors\":\"E. Dubois, E. Robilliart\",\"doi\":\"10.1109/IEDM.1995.499372\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A fast numerical resolution of the Poisson and current continuity equations is used to model non-quasi-static effects in MOS circuits under fast switching conditions. The resulting model is continuous over all regimes of operation and accounts for the non-instantaneous redistribution of the channel charge. The capabilities of this modelling approach are exemplified through the simulation of current mode analog circuits.\",\"PeriodicalId\":137564,\"journal\":{\"name\":\"Proceedings of International Electron Devices Meeting\",\"volume\":\"93 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of International Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.1995.499372\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1995.499372","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Efficient non-quasi-static MOSFETs model for circuit simulation
A fast numerical resolution of the Poisson and current continuity equations is used to model non-quasi-static effects in MOS circuits under fast switching conditions. The resulting model is continuous over all regimes of operation and accounts for the non-instantaneous redistribution of the channel charge. The capabilities of this modelling approach are exemplified through the simulation of current mode analog circuits.