采用大面积单层过渡金属二硫化物和逻辑/存储混合3D+IC实现单片3D图像传感器

Chih-Chao Yang, Kuan‐Chang Chiu, Cheng-Tse Chou, Chang-Ning Liao, Meng‐Hsi Chuang, Tung-Ying Hsieh, Wen-Hsien Huang, C. Shen, J. Shieh, W. Yeh, Yu-Hsiu Chen, Meng-Chyi Wu, Yi‐Hsien Lee
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引用次数: 11

摘要

通过顺序制作大面积(>2cm×2cm)单层(20A/W)的单片3D图像传感器,演示了单片3D图像传感器。采用低热预算工艺(Tsub200uA/um)制备的底部3D可堆叠多晶硅纳米线场效应管。低驱动电压6T SRAM在VDD=0.5V时的静态噪声裕度(SNM)为150 mV。将大面积单层TMD光电晶体管阵列集成在逻辑/存储混合3D+IC上,实现了低功耗、低成本的单片3D图像传感器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Enabling monolithic 3D image sensor using large-area monolayer transition metal dichalcogenide and logic/memory hybrid 3D+IC
A monolithic 3D image sensor is demonstrated by sequentially fabricating large-area (>2cm×2cm) monolayer (<;1nm) transition metal dichalcogenide (TMD) phototransistor array on top of a 3D logic/memory hybrid 3D+IC connected by high density interconnect. The photocurrent of the monolayer MoS2 phototransistor shows a linear response to the incident laser power density and exhibits high responsivity (>20A/W). The bottom 3D stackable poly-Si nanowire FET, fabricated by low thermal budget process (Tsub<;400°C), represents steep subthreshold swing (<;120mV/dec.) and high driving current (>200uA/um). The low driving voltage 6T SRAM shows a static noise margin (SNM) of 150 mV at VDD=0.5V. Such integration of large-area monolayer TMD phototransistor array on logic/memory hybrid 3D+IC enables the low power and low cost monolithic 3D image sensor.
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