面向未来SoC的SOI技术

Y. Inoue
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引用次数: 0

摘要

SOI CMOS器件的研究已经进行了很长时间,随着SOI晶片质量的提高和CMOS器件速度性能的提高变得越来越困难,SOI晶片已经进入了实用阶段。使用SOI CMOS有两种方法。一种是浮体结构的SOI CMOS,另一种是体系结构的SOI CMOS。在体系结构的情况下,可以实现具有体硅兼容性的布局,并且可以抑制由于浮体结构而产生的历史效应。为了保持体硅CMOS技术的兼容性,我们开发了混合沟槽技术,实现了每个晶体管的体系结构和NMOS和PMOS晶体管之间的完全隔离。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SOI technology for future SoC
SOI CMOS devices have been investigated for a long time and as the quality of SOI wafers has been improved as the same level of bulk-Si wafers and improvement of the speed performance of CMOS devices is becoming difficult, they have entered the phase of practical use. There are two approaches for the usage of SOI CMOS. One approach is the SOI CMOS in floating-body structure and the other is the one in body-tied structure. In the case of body-tied structure it is possible to realize the layout with the bulk-Si compatibility and to suppress the history effect due to the floating body structure. To keep the compatibility of bulk-Si CMOS technology, we developed the hybrid trench technology, which realizes the body-tied structure for each transistor and full isolation between NMOS and PMOS transistors.
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