迭代逻辑网络中测试生成的代数方法

ICM 2001 Proceedings. The 13th International Conference on Microelectronics. Pub Date : 1900-01-01 DOI:10.1109/ICM.2001.997649

M.A. Seghrouchni, M. Eleuldj

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摘要

本文对迭代逻辑网络的测试概念进行了推广。提出了一种迭代逻辑网络测试生成的代数方法。生成的试验在卡滞故障模型[Feng 81b]和功能故障模型[Eleu 88]下进行。定义了三种类型的检验:u检验、nu检验和m检验。

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An algebraic approach for test generation in iterative logic networks

This paper deals with a generalisation of test concepts for iterative logic networks. We present an algebraic approach for test generation in iterative logic networks. The generated test is under the stuck-at fault model [Feng 81b] and the functional fault model [Eleu 88]. Three types of tests are defined : the U-test, NU-test and M-test.

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ICM 2001 Proceedings. The 13th International Conference on Microelectronics.

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