烧结银(Ag)作为无铅模具的附着材料

K. Siow
{"title":"烧结银(Ag)作为无铅模具的附着材料","authors":"K. Siow","doi":"10.1109/IEMT.2012.6521795","DOIUrl":null,"url":null,"abstract":"This paper documents the feasibility study of using micrometer-scale Ag paste as a lead-free (Pb-free) die attach material for microelectronic packaging. Currently, there is no viable Pb-free die attach in the market which can pass the reliability testing regimen. Sintered Ag was explored as an interconnect material because of its relatively low processing temperature and robust joint after sintered. This report suggests a possible route for using Ag paste as a Pb-free die attach by dispensing as per current production epoxy die attach. This feasibility study reports the mechanical integrity, electrical and reliability testing of a surface mount power package with four types of dispensable Ag pastes. Separate lots of this surface-mount power package with current die attach materials were also evaluated as controls. This paper is expected to be of interest to companies that are exploring alternative Pb-free die attach materials.","PeriodicalId":315408,"journal":{"name":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","volume":"122 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Sintered silver (Ag) as lead-free die attach materials\",\"authors\":\"K. Siow\",\"doi\":\"10.1109/IEMT.2012.6521795\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper documents the feasibility study of using micrometer-scale Ag paste as a lead-free (Pb-free) die attach material for microelectronic packaging. Currently, there is no viable Pb-free die attach in the market which can pass the reliability testing regimen. Sintered Ag was explored as an interconnect material because of its relatively low processing temperature and robust joint after sintered. This report suggests a possible route for using Ag paste as a Pb-free die attach by dispensing as per current production epoxy die attach. This feasibility study reports the mechanical integrity, electrical and reliability testing of a surface mount power package with four types of dispensable Ag pastes. Separate lots of this surface-mount power package with current die attach materials were also evaluated as controls. This paper is expected to be of interest to companies that are exploring alternative Pb-free die attach materials.\",\"PeriodicalId\":315408,\"journal\":{\"name\":\"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)\",\"volume\":\"122 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.2012.6521795\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2012.6521795","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

本文对微米级银浆作为微电子封装无铅(pb)贴片材料的可行性进行了研究。目前,市场上还没有能够通过可靠性测试方案的可行的无铅模具附件。烧结银具有加工温度较低、烧结后接头牢固等优点,被开发作为一种互连材料。本报告提出了一种可能的途径,即使用银膏作为无铅的模具附着物,按目前生产的环氧树脂模具附着物进行分配。本可行性研究报告了一种表面贴装电源封装的机械完整性、电气和可靠性测试。该表面贴装电源封装采用当前的模具贴装材料的单独批次也作为对照进行了评估。这篇论文预计将有兴趣的公司,正在探索替代无铅的模具附加材料。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Sintered silver (Ag) as lead-free die attach materials
This paper documents the feasibility study of using micrometer-scale Ag paste as a lead-free (Pb-free) die attach material for microelectronic packaging. Currently, there is no viable Pb-free die attach in the market which can pass the reliability testing regimen. Sintered Ag was explored as an interconnect material because of its relatively low processing temperature and robust joint after sintered. This report suggests a possible route for using Ag paste as a Pb-free die attach by dispensing as per current production epoxy die attach. This feasibility study reports the mechanical integrity, electrical and reliability testing of a surface mount power package with four types of dispensable Ag pastes. Separate lots of this surface-mount power package with current die attach materials were also evaluated as controls. This paper is expected to be of interest to companies that are exploring alternative Pb-free die attach materials.
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