微电子封装用新型环氧树脂组合物

M. Sambasivam, R. Ghoshal, Proshanto Mukerji
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引用次数: 0

摘要

使用专有的环氧树脂,新配方已开发用于微电子封装应用。这些配方的主要特点是固化周期短,在25°C下长期稳定,固化挥发性低,吸湿性低,热膨胀系数(CTE)低,对各种基材的附着力优异。温度在0-200℃之间,CTE不会有明显变化。这种独特的行为归因于固化状态下基础树脂的互穿网络(IPN)结构。IPN结构的进一步证据是在- 150°C和- 150°C之间的动态力学测试中观察到的宽损失模量和tan 6。这些催化剂固化体系中广泛的固化反应产生了高度交联的聚合物网络,具有良好的耐湿性(在85°C/85% RH下14天后< 0.2°o)和热稳定性(固化材料在300°C时< 0.3 wt %)。在85/85条件下,没有观察到明显的模量变化。在动态扫描量热计(DSC)中进行的固化程度研究显示完全固化,没有后处理要求。这些配方的固化周期范围从140°C下的1小时到170°C下的约1分钟。目前,正在进行固化应力、断裂韧性(体积和界面)和各种可靠性测试,以表征下填料、球形顶部密封剂和模贴胶。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Novel Epoxy Compositions for Microelectronic Packaging Applications
Using proprietary epoxies, new formulations have been developed for use in microelectronic packaging applications. The key features of these formulations are short cure cycle, long term stability at 25° C, very low cure volatile, low moisture absorption, low coefficient of thermal expansion (CTE), excellent adhesion to various substrates. The CTE does not change appreciably with temperature between 0–200°C. This unique behavior is attributed to the interpenetrating network-like (IPN) structure of the base resins in the cured state. Further evidence of the IPN structure is the broad loss modulus and tan 6, observed between −150°C and −150°C, in dynamic mechanical tests. The extensive curing reaction in these catalyst-cured systems results in a highly crosslinked polymer network with good moisture resistance (< 0.2°o after 14 days in 85°C/85% RH) and thermal stability (< 0.3 wt % at 300°C of the cured material). Under 85/85 conditions, no appreciable changes in modulus was observed. Extent of cure studies in a dynamic scanning calorimeter (DSC) show a complete cure with no postcure requirements. Cure cycles for these formulations range from 1 hour at 140°C to about 1 minute @170°C. Currently, cure stresses, fracture toughness (bulk and interfacial), and various reliability tests are being performed to characterize the underfill, glob top encapsulants, and die-attach adhesives.
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