N. Nobeen, K. Ahmad, D. Whalley, D. Hutt, B. Haworth
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摘要

对于高压直流(HVDC)方案中使用的功率晶闸管器件,尽管塑料包装已经在各种高可靠性应用(例如航空航天和军事)中成功地取代了密封封装,但仍在使用密封封装。尽管密封技术在可靠性和性能方面表现出色,但如果用于未来高压直流输电方案的晶闸管器件,它们也存在一些缺点。这是因为未来的高压直流输电方案将要求具有更高的电流/电压额定值,例如,为了满足中国、巴西、印度等快速发展的大国日益增长的能源需求,而这些系统将需要基于更大半导体晶圆直径的晶闸管。因此,这将导致包裹更大、更脆弱、更昂贵。预计通过从目前的陶瓷外壳切换到聚合物材料,该设备将比目前的密封结构更坚固,更便宜,更轻。然而,这种转变在材料选择、设计和制造方面也带来了许多挑战。潜在的问题包括聚合物对水分的渗透性,分层,空洞,裂纹形成,这些都可能导致晶闸管失效。为了评估聚合物外壳的性能和可靠性是否可以与当前的陶瓷封装相媲美,开发并测试了聚合物封装演示器。除了进行电气和热建模研究以研究包装的行为外,还进行了不同的活动,例如确定合适的候选材料和外壳的设计概念,以及制造的聚合物外壳的可靠性,以开发外壳。本文讨论的正是这些活动。例如,从材料选择研究中,聚合物,如聚酰亚胺(PI)和环氧树脂,被确定为外壳所需的高工作温度和良好电气性能的理想候选者。通过温度循环加速寿命试验的可靠性研究,验证了所制聚合物外壳的可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Polymeric packaging of high power semiconductor devices: Material selection & reliability assessment
For power thyristor devices used in high voltage direct current (HVDC) schemes, hermetic packages are still being used despite plastic packaging having made successful progress towards replacing them in various high reliability applications, e.g. aerospace and military. Although hermetic technologies have demonstrated an excellent history of reliability and performance, they offer several drawbacks, if used for the thyristor devices intended for future HVDC transmission schemes. This is because future HVDC schemes will be required to have higher current/voltage ratings e.g. to meet the increasing energy demands from large and rapidly developing countries, such as China, Brazil, India, etc., and such systems will require thyristors based on larger semiconductor wafer diameters. Consequently, this will drive the packages to be bigger, more fragile and expensive. It is expected that by switching from the present ceramic housings to a polymer material, the device will be more robust, cheaper and lighter than the current hermetic configuration. However, such a shift also provides many challenges in terms of materials selection, design and manufacturing. Potential issues include polymer permeability to moisture, delamination, voiding, crack formation which could all lead to thyristor failure. To assess whether the performance and reliability of a polymer housing can be comparable to current ceramic packages, a polymeric package demonstrator was developed and tested. Along with electrical and thermal modelling studies performed to study the package behaviour, different activities, such as identifying appropriate material candidates and design concepts for the housing, and reliability of the manufactured polymer housing, were also carried out to develop the housing. It is these activities that are discussed in this paper. For instance, from the material selection study, polymers, such as polyimide (PI) and epoxy, were identified as being ideal candidates for the high operating temperature and good electrical performance required from the housing. From the reliability study which comprised of temperature cycling accelerated life tests, the manufactured polymer housing was concluded to be reliable.
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