QTAG: a standard for test fixture based I/sub DDQ//I/sub SSQ/ monitors

This paper describes the goals and history of the Quality Test Action Group (QTAG) since if was formed at the 1993 International Test Conference. QTAG was created to provide the industry with a de-facto standard for I/sub DDQ//I/sub SSQ/ monitors on test fixtures for production testing of CMOS ICs. The group was needed because informal discussions between the semiconductor test departments and the ATE vendors over the past decade had failed to generate the ATE based I/sub DDQ/ test instrumentation needed by the semiconductor industry.