低功率加权伪随机测试模式生成的发射捕获延迟测试*

2020 IEEE 38th VLSI Test Symposium (VTS) Pub Date : 2020-04-01 DOI:10.1109/VTS48691.2020.9107597

D. Xiang, J. Cai, Bo Liu

{"title":"低功率加权伪随机测试模式生成的发射捕获延迟测试*","authors":"D. Xiang, J. Cai, Bo Liu","doi":"10.1109/VTS48691.2020.9107597","DOIUrl":null,"url":null,"abstract":"A new weighted pseudo-random test generator called wPRPG is proposed for low-power launch-on-capture (LOC) transition delay fault testing. The low-power weighted PRPG is implemented by assigning different weights on the test enable signals and applying a gating technique. The new low-power PRPG can achieve much higher transition delay fault coverage in LOC delay testing than the conventional test-per-scan PRPG.","PeriodicalId":326132,"journal":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","volume":"66 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Low-Power Weighted Pseudo-Random Test Pattern Generation for Launch-on-Capture Delay Testing*\",\"authors\":\"D. Xiang, J. Cai, Bo Liu\",\"doi\":\"10.1109/VTS48691.2020.9107597\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new weighted pseudo-random test generator called wPRPG is proposed for low-power launch-on-capture (LOC) transition delay fault testing. The low-power weighted PRPG is implemented by assigning different weights on the test enable signals and applying a gating technique. The new low-power PRPG can achieve much higher transition delay fault coverage in LOC delay testing than the conventional test-per-scan PRPG.\",\"PeriodicalId\":326132,\"journal\":{\"name\":\"2020 IEEE 38th VLSI Test Symposium (VTS)\",\"volume\":\"66 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE 38th VLSI Test Symposium (VTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTS48691.2020.9107597\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 38th VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS48691.2020.9107597","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

提出了一种新的加权伪随机测试发生器wPRPG，用于低功耗捕获后发射(LOC)过渡延迟故障测试。通过对测试使能信号分配不同的权重并应用门控技术，实现了低功耗加权PRPG。与传统的逐扫描测试PRPG相比，这种新型低功耗PRPG在LOC延迟测试中可以实现更高的过渡延迟故障覆盖率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Low-Power Weighted Pseudo-Random Test Pattern Generation for Launch-on-Capture Delay Testing*

A new weighted pseudo-random test generator called wPRPG is proposed for low-power launch-on-capture (LOC) transition delay fault testing. The low-power weighted PRPG is implemented by assigning different weights on the test enable signals and applying a gating technique. The new low-power PRPG can achieve much higher transition delay fault coverage in LOC delay testing than the conventional test-per-scan PRPG.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2020 IEEE 38th VLSI Test Symposium (VTS)

自引率

0.00%

发文量