NAND树准确诊断板级引脚故障

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI:10.1109/TEST.1994.528028

G. Robinson

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引用次数: 2

摘要

在一些半导体测试方法中使用的NAND树结构已经在电路板测试环境中用作开放输入和双向引脚的简单测试。半导体测试时使用的测试方法在电路板测试时有一个不幸的问题:它们给出了不正确的诊断。本文描述了一种新的测试程序，可以避免这个问题。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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NAND trees accurately diagnose board-level pin faults

The NAND tree structures used in some semiconductor test methods have been used in board test environments as a simple test for open input and bidirectional pins. The test methods used at semiconductor test time have an unfortunate problem when used at board test: they give an incorrect diagnosis. A new test procedure is described that avoids this problem.

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Proceedings., International Test Conference

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