第二代ColdFire/sup R/微处理器测试开发案例研究

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI:10.1109/TEST.1997.639645

Michael Mateja, A. Crouch, R. Eisele, G. Giles, Dale Amason

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引用次数: 15

摘要

本文以第二代ColdFire/sup R/微处理器系列测试方法设计的发展为例，从目标、初始策略和实现的角度进行了描述。方法包括高速扫描路径设计，路径延迟测试，I/sub DDQ/和嵌入式存储器的直接访问测试模式。应用扫描测试的时间与为峰值性能正常操作指定的时间相同。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A case study of the test development for the 2nd generation ColdFire/sup R/ microprocessors

A case study of the development of the design for test methodology of the second generation of the ColdFire/sup R/ Microprocessor Family is described from the viewpoint of goals, initial strategy and implementation. Methodology includes at-speed scan path design, path delay testing, I/sub DDQ/ and direct access test modes for embedded memories. Scan tests are applied with timing identical to that specified for peak performance normal operation.

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Proceedings International Test Conference 1997

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