模拟和混合信号技术的可靠性挑战

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2007-07-11 DOI:10.1109/IPFA.2007.4378073

P. Chaparala, D. Brisbin, Jonggook Kim, Barry OConnell

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引用次数: 5

摘要

高速、低噪声、低功耗、高精度、高电压等独特的模拟产品应用需求需要复杂的模拟工艺技术。这种复杂性给每种技术带来了一些特定的可靠性挑战。在本文中，一些关键的可靠性机制在最常见的模拟过程技术的重点。为了满足广泛的模拟集成电路可靠性要求，除了传统的工艺可靠性鉴定外，还必须对器件进行深入的可靠性鉴定。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Reliability Challenges in Analog and Mixed Signal Technologies

Unique analog product application requirements such as high speed, low noise, low power, high precision and high voltage demand complex analog process technologies. This complexity poses several reliability challenges that are specific to each technology. In this paper some of the key reliability mechanisms in most common analog process technologies are highlighted. To meet broad range of analog IC reliability requirements, in-depth device reliability characterization is essential besides the traditional process reliability qualification.

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来源期刊

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits

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