大规模可观测环境下的顺序测试生成

Proceedings of IEEE 3rd Asian Test Symposium (ATS) Pub Date : 1994-11-15 DOI:10.1109/ATS.1994.367243

P. Varma

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引用次数: 2

摘要

本文介绍了一种用于静态电流监测和门阵列嵌入式测试点等大规模可观测环境下电路的顺序测试生成方法。本文还讨论了提高电路可控性的技术，并提出了一种在测试模式下可访问的存储元件的选择算法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Sequential test generation in massive observability environments

This paper describes a sequential test generation method for circuits in massive observability environments such as those offered by quiescent current monitoring and gate arrays with embedded test points. Techniques to enhance the controllability of the circuit are also discussed and an algorithm for selecting storage elements to make accessible during the test mode is proposed.<>

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Proceedings of IEEE 3rd Asian Test Symposium (ATS)

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