带伪差分输入的感测放大器系统级静电触发软故障的测量与分析

2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) Pub Date : 2018-09-01 DOI:10.23919/EOS/ESD.2018.8509690

Myeongjo Jeong, Junsik Park, Jinwoo Kim, M. Seung, Seokkiu Lee, Jingook Kim

{"title":"带伪差分输入的感测放大器系统级静电触发软故障的测量与分析","authors":"Myeongjo Jeong, Junsik Park, Jinwoo Kim, M. Seung, Seokkiu Lee, Jingook Kim","doi":"10.23919/EOS/ESD.2018.8509690","DOIUrl":null,"url":null,"abstract":"A sense amplifier flip-flop, which is commonly used as an input receiver in a DRAM, is designed in the simplified motherboard and DIMM structures of a laptop PC. System-level ESD-induced soft failures of the sense amplifier flip-flop are measured and validated with SPICE simulation.","PeriodicalId":328499,"journal":{"name":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Measurement and Analysis of System-level ESD-induced Soft Failures of a Sense Amplifier Flip-Flop with Pseudo Differential Inputs\",\"authors\":\"Myeongjo Jeong, Junsik Park, Jinwoo Kim, M. Seung, Seokkiu Lee, Jingook Kim\",\"doi\":\"10.23919/EOS/ESD.2018.8509690\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A sense amplifier flip-flop, which is commonly used as an input receiver in a DRAM, is designed in the simplified motherboard and DIMM structures of a laptop PC. System-level ESD-induced soft failures of the sense amplifier flip-flop are measured and validated with SPICE simulation.\",\"PeriodicalId\":328499,\"journal\":{\"name\":\"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/EOS/ESD.2018.8509690\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EOS/ESD.2018.8509690","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

在笔记本电脑的简化主板和内存条结构中，设计了一种通常用作DRAM输入接收器的感测放大器触发器。通过SPICE仿真对传感器放大器的系统级静电触发软失效进行了测量和验证。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Measurement and Analysis of System-level ESD-induced Soft Failures of a Sense Amplifier Flip-Flop with Pseudo Differential Inputs

A sense amplifier flip-flop, which is commonly used as an input receiver in a DRAM, is designed in the simplified motherboard and DIMM structures of a laptop PC. System-level ESD-induced soft failures of the sense amplifier flip-flop are measured and validated with SPICE simulation.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

自引率

0.00%

发文量