交叉场放大器端帽效应的测量

J. Browning, C. Chan, J. Ye, R. Macgregor, T. Ruden
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引用次数: 1

摘要

线性格式,低频(150mhz),低功率(10至100w),交叉场放大器与可变偏置,静电限制电极(端帽)操作。发现端帽偏压只在端帽附近引起电子输运。端帽电流测量表明,当端帽偏置比浮电位更正时,可以收集电子束电流的很大一部分(40%)。所观察到的增益与端偏置的变化可以用损失的光束电流来解释。器件增益与单偏置测量值已进行了数值模拟比较,结果基本一致。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Measurement of end-hat effects in a crossed-field amplifier
A linear format, low frequency (150 MHz), low power (10 to 100 W), crossed-field amplifier is operated with variable bias, electrostatic confining electrodes (end-hats). The end-hat bias is found to cause electron transport only in the vicinity of the end-hats. End-hat current measurements indicate a substantial part of the electron beam current (40%) can be collected when the end-hats are biased more positive than the floating potential. The observed change in gain versus end-hat bias can be accounted for by the lost beam current. Device gain versus sole bias measurements have been compared with numerical simulations and give general agreement.<>
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