过度测试还是不过度测试——问题多于答案

I. Pomeranz
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摘要

只提供摘要形式。当在芯片的功能操作条件下无法检测到的缺陷由于在测试应用期间创建的非功能条件而被检测到时,就会发生过度测试。更一般地说,过度测试是指在测试应用期间芯片在功能模式下正常工作时发生的芯片故障。因此,过度测试会导致不必要的产量损失。在用于检测转换故障的基于双模式扫描的测试中,报告了过度测试。然而,更广泛的测试和缺陷类型可能涉及到过度测试。本演讲回顾了解决过度测试的现有方法。这些方法大致可分为基于冗余故障和基于操作条件。基于冗余故障的方法试图防止不影响电路功能运行的故障被检测到。基于操作条件的方法试图确保避免通过扫描(或其他为可测试性而设计的逻辑)实现的非功能性操作。这些方法中的功能操作条件被定义为当电路处于可达状态空间时发生。对于可同步电路,这包括电路在同步后可以访问的每个状态。本讲座将讨论这些方法之间的根本区别,以及它们的优点和局限性。方法之间的差异可以从以下方面看出:1)可检测的故障可能具有使用不可达状态检测它的测试。2)使用可达状态扫描时可能会检测到冗余故障。该演讲还提出了与过度测试相关的问题,包括以下内容:1)应该(总是)避免过度测试吗?2)过度测试的避免应该只关注转换(延迟)错误和基于扫描的测试吗?3)即使在功能运行条件下测试可以实现完全的故障覆盖,测试集是否足够全面?是否有避免过度测试的首选方法?
本文章由计算机程序翻译,如有差异,请以英文原文为准。
To Overtest Or Not To Overtest - More Questions Than Answers
Summary form only given. Overtesting occurs when a defect that would not be detected under functional operation conditions of a chip is detected due to non-functional conditions created during test application. More generally, overtesting refers to a failure of a chip that occurs during test application when the chip would operate correctly in functional mode. Thus, overtesting results in yield loss that is arguably unnecessary. Overtesting was reported under two-pattern scan-based tests applied for detecting transition faults. However, a wider range of test and defect types may be involved in overtesting. This talk reviews the existing methodologies for addressing overtesting. These methodologies can be broadly classified as based on redundant faults, or based on operation conditions. Methodologies based on redundant faults attempt to prevent faults, which do not affect the functional operation of the circuit, from being detected. Methodologies based on operation conditions attempt to ensure that non-functional operation, which is made possible by scan (or other design-for-testability logic), is avoided. Functional operation conditions in these methodologies are defined to occur when the circuit is in its reachable state space. For a synchronizable circuit, this includes every state that the circuit can visit after synchronization. This talk discusses the fundamental differences between these methodologies, their advantages and limitations. The differences between the methodologies can be seen from the following: 1) A detectable fault may have a test that detects it using a non-reachable state. 2) A redundant fault may become detectable under scan using a reachable state. The talk also raises questions related to overtesting, including the following: 1) Should overtesting (always) be avoided? 2) Should avoidance of overtesting focus only on transition (delay) faults and scan based tests? 3) Even if testing under functional operation conditions can achieve complete fault coverage, is the test set comprehensive enough? 4) Is there a preferred class of methodologies for avoiding overtesting?
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