{"title":"构建双极浮动电源模块","authors":"Y. Chek, T. C. Liew","doi":"10.1109/IEMT.2012.6521754","DOIUrl":null,"url":null,"abstract":"They are various type of automated test equipment (ATE) in the market targeted for testing different types of devices. For example, high voltage and high current ATE for power management devices. A mix signal ATE for devices required analog and digital testing with relatively lower power demand compared to power management devices. What if the device required high power and mix signal testing together? The paper proposed a method to overcome the ATE capability constraint by using a floating power supply hardware module to step up the ATE supply voltage.","PeriodicalId":315408,"journal":{"name":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","volume":"80 4","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Building a bipolar floating power supply module\",\"authors\":\"Y. Chek, T. C. Liew\",\"doi\":\"10.1109/IEMT.2012.6521754\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"They are various type of automated test equipment (ATE) in the market targeted for testing different types of devices. For example, high voltage and high current ATE for power management devices. A mix signal ATE for devices required analog and digital testing with relatively lower power demand compared to power management devices. What if the device required high power and mix signal testing together? The paper proposed a method to overcome the ATE capability constraint by using a floating power supply hardware module to step up the ATE supply voltage.\",\"PeriodicalId\":315408,\"journal\":{\"name\":\"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)\",\"volume\":\"80 4\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.2012.6521754\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2012.6521754","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
They are various type of automated test equipment (ATE) in the market targeted for testing different types of devices. For example, high voltage and high current ATE for power management devices. A mix signal ATE for devices required analog and digital testing with relatively lower power demand compared to power management devices. What if the device required high power and mix signal testing together? The paper proposed a method to overcome the ATE capability constraint by using a floating power supply hardware module to step up the ATE supply voltage.