M. Rencz, A. Poppe, E. Kollár, S. Ress, V. Székely, B. Courtois
{"title":"基于结构功能的热测量方法误差的修正程序","authors":"M. Rencz, A. Poppe, E. Kollár, S. Ress, V. Székely, B. Courtois","doi":"10.1109/STHERM.2004.1291307","DOIUrl":null,"url":null,"abstract":"In this paper a methodology is presented to correct the systematic error of structure function based thermal material parameter measuring methods. This error stems from the fact that it is practically impossible to avoid parallel heat-flow paths in case of forced one-dimensional heat conduction. With the presented method we show how to subtract the effect of the parallel heat-flow paths from the measured structure function. With this correction methodology the systematic error of structure function based thermal material parameter measuring methods can be practically eliminated. Application examples demonstrate the accuracy increase obtained with the use of the method.","PeriodicalId":409730,"journal":{"name":"Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545)","volume":"17 ","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-03-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":"{\"title\":\"A procedure to correct the error in the structure function based thermal measuring methods\",\"authors\":\"M. Rencz, A. Poppe, E. Kollár, S. Ress, V. Székely, B. Courtois\",\"doi\":\"10.1109/STHERM.2004.1291307\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper a methodology is presented to correct the systematic error of structure function based thermal material parameter measuring methods. This error stems from the fact that it is practically impossible to avoid parallel heat-flow paths in case of forced one-dimensional heat conduction. With the presented method we show how to subtract the effect of the parallel heat-flow paths from the measured structure function. With this correction methodology the systematic error of structure function based thermal material parameter measuring methods can be practically eliminated. Application examples demonstrate the accuracy increase obtained with the use of the method.\",\"PeriodicalId\":409730,\"journal\":{\"name\":\"Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545)\",\"volume\":\"17 \",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-03-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"21\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/STHERM.2004.1291307\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.2004.1291307","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A procedure to correct the error in the structure function based thermal measuring methods
In this paper a methodology is presented to correct the systematic error of structure function based thermal material parameter measuring methods. This error stems from the fact that it is practically impossible to avoid parallel heat-flow paths in case of forced one-dimensional heat conduction. With the presented method we show how to subtract the effect of the parallel heat-flow paths from the measured structure function. With this correction methodology the systematic error of structure function based thermal material parameter measuring methods can be practically eliminated. Application examples demonstrate the accuracy increase obtained with the use of the method.