筛选高速串行接口ip意外故障的经济有效的测试方法

2020 IEEE International Test Conference (ITC) Pub Date : 2020-11-01 DOI:10.1109/ITC44778.2020.9325235

Sang-Uck Ahn, Beom-Kyu Seo, Hyun-Woo Kim, Yeoun-Sook Shin, Hyung-Tae Kim, Ghil-Geun Oh, Young-Dae Kim

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引用次数: 1

摘要

在使用交流耦合配置的高速串行接口(HSSI) IP中，由于交流耦合配置，可能会导致无法筛选失败芯片的意外问题。即外环回测试不能拒绝故障芯片，即使正负差分信号中的一个是异常状态，如引脚浮动或打开。本文提出了一种经济有效的测试方法，通过简单的电路修改和额外的测试程序，可以在不降低测量性能的情况下筛选出意外故障。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Cost-Effective Test Method for screening out Unexpected Failure in High Speed Serial Interface IPs

In High-Speed Serial Interface (HSSI) IP using AC coupled configuration, due to the AC coupled configuration, it can cause unexpected issues that cannot screen fail chips. That is, external loopback test is not able to reject the fail chip, even if one of the differential positive and negative signals is abnormal status, such as pin floating or open. This paper proposes a cost effective test method can screen unexpected failure without measurement performance degradation assisted by simple circuit modification and additional test sequence.

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来源期刊

2020 IEEE International Test Conference (ITC)

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