{"title":"基于tsv的三维集成电路的电容耦合缓解","authors":"Ashkan Eghbal, Pooria M. Yaghini, N. Bagherzadeh","doi":"10.1109/VTS.2015.7116279","DOIUrl":null,"url":null,"abstract":"TSV-to-TSV capacitive coupling has large disruptive effects on timing requirements of the circuit. The latency effect of TSV-to-TSV capacitive coupling for different characteristics of a TSV using circuit-level model is presented in this article. Two coding approaches are proposed to mitigate capacitive parasitic effects by adjusting the current flow pattern for any given n × n mesh of TSV arrangement to reduce the number of 8C/7C parasitic capacitance. The experimental results proves the efficacy of the proposed coding methods.","PeriodicalId":187545,"journal":{"name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","volume":"55 3","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Capacitive Coupling Mitigation for TSV-based 3D ICs\",\"authors\":\"Ashkan Eghbal, Pooria M. Yaghini, N. Bagherzadeh\",\"doi\":\"10.1109/VTS.2015.7116279\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"TSV-to-TSV capacitive coupling has large disruptive effects on timing requirements of the circuit. The latency effect of TSV-to-TSV capacitive coupling for different characteristics of a TSV using circuit-level model is presented in this article. Two coding approaches are proposed to mitigate capacitive parasitic effects by adjusting the current flow pattern for any given n × n mesh of TSV arrangement to reduce the number of 8C/7C parasitic capacitance. The experimental results proves the efficacy of the proposed coding methods.\",\"PeriodicalId\":187545,\"journal\":{\"name\":\"2015 IEEE 33rd VLSI Test Symposium (VTS)\",\"volume\":\"55 3\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-04-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 33rd VLSI Test Symposium (VTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTS.2015.7116279\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 33rd VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2015.7116279","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Capacitive Coupling Mitigation for TSV-based 3D ICs
TSV-to-TSV capacitive coupling has large disruptive effects on timing requirements of the circuit. The latency effect of TSV-to-TSV capacitive coupling for different characteristics of a TSV using circuit-level model is presented in this article. Two coding approaches are proposed to mitigate capacitive parasitic effects by adjusting the current flow pattern for any given n × n mesh of TSV arrangement to reduce the number of 8C/7C parasitic capacitance. The experimental results proves the efficacy of the proposed coding methods.