{"title":"ZnO薄膜中的1/ f噪声","authors":"L. Yang, G. Leroy, J. Gest, L. Vandamme","doi":"10.1109/ICNF.2011.5994393","DOIUrl":null,"url":null,"abstract":"We have investigated the low-frequency noise of ZnO film deposited by dc sputtering technique on glass substrate. We characterized the noise below 100kHz and obtained classical 1/ƒ spectra. We attempted to verify the validity of Hooge's empirical relation and to test its usefulness as a diagnostic tool. The 1/ƒ noise normalized for bias, frequency and unit area, Cus is proportional with the sheet resistance Rsh. We found that the noise results depend strongly on illumination.","PeriodicalId":137085,"journal":{"name":"2011 21st International Conference on Noise and Fluctuations","volume":"78 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"1/ƒ noise in ZnO films\",\"authors\":\"L. Yang, G. Leroy, J. Gest, L. Vandamme\",\"doi\":\"10.1109/ICNF.2011.5994393\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We have investigated the low-frequency noise of ZnO film deposited by dc sputtering technique on glass substrate. We characterized the noise below 100kHz and obtained classical 1/ƒ spectra. We attempted to verify the validity of Hooge's empirical relation and to test its usefulness as a diagnostic tool. The 1/ƒ noise normalized for bias, frequency and unit area, Cus is proportional with the sheet resistance Rsh. We found that the noise results depend strongly on illumination.\",\"PeriodicalId\":137085,\"journal\":{\"name\":\"2011 21st International Conference on Noise and Fluctuations\",\"volume\":\"78 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 21st International Conference on Noise and Fluctuations\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICNF.2011.5994393\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 21st International Conference on Noise and Fluctuations","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICNF.2011.5994393","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We have investigated the low-frequency noise of ZnO film deposited by dc sputtering technique on glass substrate. We characterized the noise below 100kHz and obtained classical 1/ƒ spectra. We attempted to verify the validity of Hooge's empirical relation and to test its usefulness as a diagnostic tool. The 1/ƒ noise normalized for bias, frequency and unit area, Cus is proportional with the sheet resistance Rsh. We found that the noise results depend strongly on illumination.
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