{"title":"一种用于DAC和ADC的简化多项式拟合算法","authors":"S. Sunter, N. Nagi","doi":"10.1109/TEST.1997.639641","DOIUrl":null,"url":null,"abstract":"An accurate and simple method is introduced for determining the third order polynomial that best fits a set of data points containing random noise. The coefficients of the polynomial are translated into offset, gain, and harmonic distortion for an analog-to-digital converter (ADC) driven by a digital-to-analog converter (DAC) or other appropriate signal source. The algorithm is efficient enough to be implemented as a built-in self-test for an IC, and is particularly suitable for sigma-delta converters.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"167","resultStr":"{\"title\":\"A simplified polynomial-fitting algorithm for DAC and ADC BIST\",\"authors\":\"S. Sunter, N. Nagi\",\"doi\":\"10.1109/TEST.1997.639641\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An accurate and simple method is introduced for determining the third order polynomial that best fits a set of data points containing random noise. The coefficients of the polynomial are translated into offset, gain, and harmonic distortion for an analog-to-digital converter (ADC) driven by a digital-to-analog converter (DAC) or other appropriate signal source. The algorithm is efficient enough to be implemented as a built-in self-test for an IC, and is particularly suitable for sigma-delta converters.\",\"PeriodicalId\":186340,\"journal\":{\"name\":\"Proceedings International Test Conference 1997\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"167\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings International Test Conference 1997\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1997.639641\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639641","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A simplified polynomial-fitting algorithm for DAC and ADC BIST
An accurate and simple method is introduced for determining the third order polynomial that best fits a set of data points containing random noise. The coefficients of the polynomial are translated into offset, gain, and harmonic distortion for an analog-to-digital converter (ADC) driven by a digital-to-analog converter (DAC) or other appropriate signal source. The algorithm is efficient enough to be implemented as a built-in self-test for an IC, and is particularly suitable for sigma-delta converters.
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