差分分析在纳米探测技术中对集成电路不稳定缺陷进行推理的应用

2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2006-07-03 DOI:10.1109/IPFA.2006.250984

G. Shen, K. Chuang

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引用次数: 0

摘要

本文的目的是提出一种新的演绎方法，该方法将差分分析应用于纳米探测技术。该方法希望解决具有尾故障或令人费解的特征的不稳定器件，但不仅要检查可疑器件是否具有不正确的特性或不匹配的晶体管参数

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Apply Difference Analysis to Nano-Probing Technique for Reasoning Erratic Defect out in Integrated Circuits

The purpose of this paper is to present a novel deductive methodology, which is accomplished by applying difference analysis to nano-probing technique. This methodology would like to resolve the erratic device with a tailing failure or puzzling feature, but not only to check if the suspect had incorrect characteristic or mismatched transistor parameters

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2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits

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