具有隐式故障效应传播需求的功能故障模型

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI:10.1109/ATS.2006.10

I. Pomeranz, S. Patil, Praveen Parvathala

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引用次数: 5

摘要

我们定义了一个不包含显式故障效应传播需求的功能故障模型。该功能故障模型的测试生成只考虑无故障电路。这简化了功能测试的生成过程。我们通过实验结果证明，基于该模型生成的功能测试序列可以有效地提供非常高的门级卡在故障覆盖率

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A Functional Fault Model with Implicit Fault Effect Propagation Requirements

We define a functional fault model that does not include explicit fault effect propagation requirements. Test generation for this functional fault model is done considering only a fault free circuit. This simplifies the functional test generation process. We demonstrate through experimental results that functional test sequences generated based on this model are effective in providing very high gate-level stuck-at fault coverage

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2006 15th Asian Test Symposium

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