专题会议:逻辑内置自检测试点插入综述

2020 IEEE 38th VLSI Test Symposium (VTS) Pub Date : 2020-04-01 DOI:10.1109/VTS48691.2020.9107584

Yang Sun, S. Millican, V. Agrawal

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引用次数: 6

摘要

本文研究了测试点(TP)体系结构和测试点插入(TPI)方法，以增加伪随机和逻辑内置自检(LBIST)故障覆盖率。我们介绍了TPI方法的历史，包括TPI用于增加卡在故障覆盖，压缩测试模式，检测路径延迟故障和降低测试功率。我们讨论了一些已知的TPs的弱点，并探讨了克服这些弱点的研究方向。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Special Session: Survey of Test Point Insertion for Logic Built-in Self-test

This article surveys test point (TP) architectures and test point insertion (TPI) methods for increasing pseudo-random and logic built-in self-test (LBIST) fault coverage. We present a history of TPI approaches, including TPI for increasing stuck-at fault coverage, compressing test patterns, detecting path delay faults, and reducing test power. We discuss some known weaknesses of TPs and explore research directions to overcome them.

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来源期刊

2020 IEEE 38th VLSI Test Symposium (VTS)

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