R. Kwasnick, A. Papathanasiou, M. Reilly, Al M. Rashid, Bashir Zaknoon, John Falk
{"title":"CPU使用条件的确定","authors":"R. Kwasnick, A. Papathanasiou, M. Reilly, Al M. Rashid, Bashir Zaknoon, John Falk","doi":"10.1109/IRPS.2011.5784455","DOIUrl":null,"url":null,"abstract":"Use condition inputs to physics-of-failure models are required to use knowledge-based qualification of ICs. Modern CPUs have multiple voltage-frequency states which vary widely in reliability stress, but it is not obvious what time in the various states to use in product qualification. We present a methodology for developing a time in state model for CPUs which combines large scale user monitoring and lab-based studies. Results for a specific CPU family, including field validation and implications for knowledge-based qualification, are discussed.","PeriodicalId":242672,"journal":{"name":"2011 International Reliability Physics Symposium","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"30","resultStr":"{\"title\":\"Determination of CPU use conditions\",\"authors\":\"R. Kwasnick, A. Papathanasiou, M. Reilly, Al M. Rashid, Bashir Zaknoon, John Falk\",\"doi\":\"10.1109/IRPS.2011.5784455\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Use condition inputs to physics-of-failure models are required to use knowledge-based qualification of ICs. Modern CPUs have multiple voltage-frequency states which vary widely in reliability stress, but it is not obvious what time in the various states to use in product qualification. We present a methodology for developing a time in state model for CPUs which combines large scale user monitoring and lab-based studies. Results for a specific CPU family, including field validation and implications for knowledge-based qualification, are discussed.\",\"PeriodicalId\":242672,\"journal\":{\"name\":\"2011 International Reliability Physics Symposium\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-04-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"30\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 International Reliability Physics Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.2011.5784455\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.2011.5784455","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Use condition inputs to physics-of-failure models are required to use knowledge-based qualification of ICs. Modern CPUs have multiple voltage-frequency states which vary widely in reliability stress, but it is not obvious what time in the various states to use in product qualification. We present a methodology for developing a time in state model for CPUs which combines large scale user monitoring and lab-based studies. Results for a specific CPU family, including field validation and implications for knowledge-based qualification, are discussed.
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