{"title":"使用基于上下文的方法进行测试数据压缩","authors":"Sara Karamati, Z. Navabi","doi":"10.1109/TEST.2010.5699301","DOIUrl":null,"url":null,"abstract":"This paper proposes a new test data compression method based on a context based binary arithmetic coding. The proposed method is suitable for fully specified test vector, benefiting from elimination of the relaxation step used in former methods. This method is evaluated using ISCAS89 full scan circuits.","PeriodicalId":265156,"journal":{"name":"2010 IEEE International Test Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Using context based methods for test data compression\",\"authors\":\"Sara Karamati, Z. Navabi\",\"doi\":\"10.1109/TEST.2010.5699301\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a new test data compression method based on a context based binary arithmetic coding. The proposed method is suitable for fully specified test vector, benefiting from elimination of the relaxation step used in former methods. This method is evaluated using ISCAS89 full scan circuits.\",\"PeriodicalId\":265156,\"journal\":{\"name\":\"2010 IEEE International Test Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2010.5699301\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2010.5699301","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Using context based methods for test data compression
This paper proposes a new test data compression method based on a context based binary arithmetic coding. The proposed method is suitable for fully specified test vector, benefiting from elimination of the relaxation step used in former methods. This method is evaluated using ISCAS89 full scan circuits.