V. Goyal, Shubham Tayal, S. Meena, Ravi Gupta, S. Bhattacharya
{"title":"用于先进半导体器件的高k栅极电介质和金属栅极堆叠技术","authors":"V. Goyal, Shubham Tayal, S. Meena, Ravi Gupta, S. Bhattacharya","doi":"10.1201/9781003121589-2","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":331396,"journal":{"name":"High-k Materials in Multi-Gate FET Devices","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High-k Gate Dielectrics and Metal Gate Stack Technology for Advance Semiconductor Devices\",\"authors\":\"V. Goyal, Shubham Tayal, S. Meena, Ravi Gupta, S. Bhattacharya\",\"doi\":\"10.1201/9781003121589-2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":331396,\"journal\":{\"name\":\"High-k Materials in Multi-Gate FET Devices\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-07-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"High-k Materials in Multi-Gate FET Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1201/9781003121589-2\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"High-k Materials in Multi-Gate FET Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9781003121589-2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}