Tom Rothe, Mudassir Ali Sayyed, Jan Langer, K. Gottfried, Jörg Schuster, Martin Stoll, H. Kuhn
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Towards knowledge-enhanced process models for semiconductor fabrication
We present a novel approach for modeling semiconductor processing that uses machine learning to combine expert knowledge, physics models, and actual process data into so-called knowledge-enhanced process models. Our method is illustrated on models for chemical-mechanical planarization, a key technology for semiconductor processing. It is an important step towards robust, accurate, and transferable, real-time models for digital twins of semiconductor processes and process chains.