{"title":"V.L.S.I.诊断使用高水平的知识","authors":"P. Chardon, C. Durante","doi":"10.1109/ATW.1994.747843","DOIUrl":null,"url":null,"abstract":"7 1 s aper introduces, a useful and effective method for VLSI dagnosis based on a theorem concerning the Boolean Difference part 2). I t , & a high level diagnosis method for high f eve1 circuits. First, modules are considered (part 3). hks between miodules are d e f i e d art 4 5)\"and. tLe more general w e is described (part 6 Y before condusion (part 7)1.","PeriodicalId":217615,"journal":{"name":"The Third Annual Atlantic Test Workshop","volume":"125 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"V.L.S.I. diagnosis using high level knowledge\",\"authors\":\"P. Chardon, C. Durante\",\"doi\":\"10.1109/ATW.1994.747843\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"7 1 s aper introduces, a useful and effective method for VLSI dagnosis based on a theorem concerning the Boolean Difference part 2). I t , & a high level diagnosis method for high f eve1 circuits. First, modules are considered (part 3). hks between miodules are d e f i e d art 4 5)\\\"and. tLe more general w e is described (part 6 Y before condusion (part 7)1.\",\"PeriodicalId\":217615,\"journal\":{\"name\":\"The Third Annual Atlantic Test Workshop\",\"volume\":\"125 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The Third Annual Atlantic Test Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATW.1994.747843\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Third Annual Atlantic Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATW.1994.747843","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
7 1 s aper introduces, a useful and effective method for VLSI dagnosis based on a theorem concerning the Boolean Difference part 2). I t , & a high level diagnosis method for high f eve1 circuits. First, modules are considered (part 3). hks between miodules are d e f i e d art 4 5)"and. tLe more general w e is described (part 6 Y before condusion (part 7)1.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
