{"title":"逻辑诊断——转移还是必要?","authors":"W. Fuch","doi":"10.1109/TEST.1997.639646","DOIUrl":null,"url":null,"abstract":"Failure diagnosis is resource intensive, frustrating, and often impossible. However, it is also critical and necessary for aggressive designs and manufacturing processes. Research in this area is making rapid progress, but the challenges are also rapidly growing in magnitude and importance.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Logic diagnosis-diversion or necessity?\",\"authors\":\"W. Fuch\",\"doi\":\"10.1109/TEST.1997.639646\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Failure diagnosis is resource intensive, frustrating, and often impossible. However, it is also critical and necessary for aggressive designs and manufacturing processes. Research in this area is making rapid progress, but the challenges are also rapidly growing in magnitude and importance.\",\"PeriodicalId\":186340,\"journal\":{\"name\":\"Proceedings International Test Conference 1997\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings International Test Conference 1997\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1997.639646\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639646","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Failure diagnosis is resource intensive, frustrating, and often impossible. However, it is also critical and necessary for aggressive designs and manufacturing processes. Research in this area is making rapid progress, but the challenges are also rapidly growing in magnitude and importance.
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