倒装芯片用单通流封装剂的新进展

J. Liu, R. Kraszewski, Xin Lin, L. Wong, S. Goh, J. Allen
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引用次数: 6

摘要

介绍了一种焊料凹凸回流后无需再固化的单道回流封装剂。作为助熔剂和密封剂,本产品具有两种功能。首先,该材料在焊料回流过程中激活焊料凸点和金属键合垫,以建立模具和基板之间的互连。其次,当这种材料被固化时,它会在模具表面和基材之间形成机械粘合。该产品允许在标准表面贴装回流剖面下同时处理普通表面贴装组件封装与倒装芯片,csp或bga。这种工艺消除了毛细管欠填充和固化时间。产品可焊性强,成品率高;经过热冲击试验,部件性能可靠。我们采用DSC, TMA, DMA和剪切测试技术来研究材料的性能。这些性能包括填料水平、固化回流曲线、固化百分比、玻璃化转变温度(T/sub g/)、热膨胀系数(CTE)、模量和模具剪切附着力的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
New developments in single pass reflow encapsulant for flip chip application
This paper introduces a series of single pass reflow encapsulants that require no post curing after solder bump reflow. Acting as a flux and an encapsulant, this product performs two functions. First, the material activates the solder bump and metallic bond pad during solder reflow to establish the interconnection between the die and substrate. Second, while this material is being cured, it forms a mechanical bond between the surface of the die and substrate. This product allows processing of normal surface mount component packages concurrently with flip chip, CSPs or BGAs under the standard surface mount reflow profile. Such a process eliminates capillary underfilling and curing time. The product's solderability is robust and high yield; the parts are reliable after thermal shock testing. We have employed DSC, TMA, DMA and shear test techniques to investigate the properties of the material. These properties include influence of filler loading level, curing reflow profile, percentage cure, glass transition temperature (T/sub g/), coefficient of thermal expansion (CTE), modulus and die shear adhesion.
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