聚合物发光二极管(PLED)显示器像素短化问题失效分析

2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. Pub Date : 2005-04-17 DOI:10.1109/RELPHY.2005.1493171

L. Wu, A. Johnson, D. Kolosov, I. Parker, J. Trujillo

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引用次数: 2

摘要

结合电学表征、光学显微镜、SEM/FIB和其他分析方法，提出了一种失效分析过程，以确定聚合物发光二极管(PLED)显示器像素短路的根本原因。短像素在全白屏幕上呈现黑色，影响显示均匀性;它们还可能因吸收过多电流而导致驱动器问题。像素短短还会带来可靠性问题，因为它可能在显示器的使用寿命期间发生在老化之后。本文讨论了FA过程和确定的失效机制。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Failure analysis of pixel shorting problems in polymer light emitting diode (PLED) displays

A failure analysis process, combining electrical characterization, optical microscopy, SEM/FIB, and other analytical methods, to identify the root cause of pixel shorts in polymer light emitting diode (PLED) displays is presented. Shorted pixels appear black on a full-on white screen, influencing the display uniformity; they could also cause driver problems by drawing excess current. Pixel shorting also poses a reliability problem, since it can occur after burn-in, during the lifetime of the display. The paper discusses the FA process and identified failure mechanisms.

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2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.

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