一个软容错LUT级联仿真器

H. Nakahara, Tsutomu Sasao
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引用次数: 1

摘要

LUT级联仿真器实现了任意顺序电路。给定一个顺序电路,我们将组合部分转换成一个或多个LUT级联,并将LUT(单元)数据存储到LUT级联模拟器的存储器中。仿真器通过顺序读取单元数据来评估多输出逻辑功能。为了提高对软错误的容忍度,存储器中的单元数据采用纠错码进行编码。此外,还附加了定期扫描存储器的纠错电路和检查电路。当检测到软错误时,它通过将正确的数据重写到内存中来消除错误。为了掩盖触发器中的软错误,采用了三模冗余技术。我们的系统在单个比特上检测到一个软错误。系统的任务时间是普通LUT级联仿真器的1000倍以上
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Soft Error Tolerant LUT Cascade Emulator
An LUT cascade emulator realizes an arbitrary sequential circuit. Given a sequential circuit, we convert the combinational part into one or more LUT cascades, and store LUT (cell) data into a memory in the LUT cascade emulator. The emulator evaluates multi-output logic functions by reading cell data sequentially. To improve the tolerance to soft errors, cell data in the memory are encoded by error correcting codes. Also, error-correcting circuits and checking circuits that periodically scan the memories are appended. When a soft error is detected, it removes the error by rewriting the correct data into the memory. To mask soft errors in flip-flops, a TMR (triple module redundancy) technique is employed. Our system detects a soft error in a single bit. Also, the mission time of the system is more than 1000times of time of an ordinary LUT cascade emulator
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