用激光探针对嵌入式SRAM进行解扰

2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2018-07-01 DOI:10.1109/IPFA.2018.8452604

S. Chef, C. T. Chua, J. Tay, Y. W. Siah, S. Bhasin, J. Breier, C. Gan

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引用次数: 3

摘要

在故障分析、缺陷定位、空间电子产品的鉴定和测试以及安全评估等各个应用领域，了解存储器的组织结构是必不可少的第一步。对于最后一个类别，可以将特定地址的本地化用于内容估计或加密密钥恢复，为此任务报告了几种技术。在本文中，我们讨论了激光探测在不同技术节点上由不同公司设计和制造的8位微控制器中嵌入的解扰存储器的应用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Descrambling of Embedded SRAM Using a Laser Probe

Understanding the organization of memory is a mandatory first step in various fields of applications such as failure analysis, defect localization, qualification and testing of space electronics, and security evaluation. For the last category, localization of specific addresses may be used for content estimation or encryption key recovery, with several techniques being reported for this task. In this paper, we discuss the application of laser probing for descrambling memory embedded in 8 bits microcontrollers designed and manufactured by different companies in various technology nodes.

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来源期刊

2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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