基于伯杰码控制的组合电路中完全测试元件的搜索算法

V. Sapozhnikov, V. Sapozhnikov, D. Efanov
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引用次数: 7

摘要

首先给出了基于伯杰码控制的组合逻辑结构中逻辑元件输出故障检测的充分必要条件。结果表明,对于给定任务的求解,不仅可以利用伯杰码识别数据向量中任意单向误差的特性,而且可以利用伯杰码检测任意非对称误差的特性。提出了一种逻辑元件可测试性分析算法。在将电路转换为可测试结构电路的过程中,应保留未测试的元件。在Berger码控制的逻辑元素的完全可测试性的形成条件的基础上,可以开发出网络约简的方法,提供与现有方法相比减少的冗余。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Search algorithm for fully tested elements in combinational circuits, controlled on the basis of berger codes
Authors describe firstly obtained necessary and sufficient conditions for detection of a logic component output fault in the combination logic structure controlled on the basis of Berger code. It is demonstrated that for the solution of the given task not only Berger code property of identifying any unidirectional errors in data vectors, but also the property of any asymmetric errors detection may be applied. An algorithm of the analysis of logical elements testability was formed. Non-tested elements in the process of transforming a circuit into a circuit with testable structure should be reserved. On the basis of formed conditions of full testability of logical elements controlled by Berger code, the methods of network reduction may be developed, providing the decreased, compared to the existing methods, redundancy.
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