{"title":"基于统计和随机方法的虚拟样机技术","authors":"S. Rzepka, A. Muller, B. Michel","doi":"10.1109/ESIME.2010.5464571","DOIUrl":null,"url":null,"abstract":"The paper reports three examples of best industrial practice showing the substantial benefits gained in terms of time-to-market reduction when virtual prototyping is enhanced by statistical and stochastic methodologies. These examples from a microelectronics setting of high volume component and module manufacturing deal with different fields: i) ball grid array (BGA) design optimization based on sophisticated design-of-experiments (DoE) and response surface (RS) schemes, ii) material modeling based on stochastic parameter identification and optimization, and iii) process pre-qualification by involving a stochastic robustness analysis.","PeriodicalId":152004,"journal":{"name":"2010 11th International Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE)","volume":"270 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Virtual prototyping advanced by statistic and stochastic methodologies\",\"authors\":\"S. Rzepka, A. Muller, B. Michel\",\"doi\":\"10.1109/ESIME.2010.5464571\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper reports three examples of best industrial practice showing the substantial benefits gained in terms of time-to-market reduction when virtual prototyping is enhanced by statistical and stochastic methodologies. These examples from a microelectronics setting of high volume component and module manufacturing deal with different fields: i) ball grid array (BGA) design optimization based on sophisticated design-of-experiments (DoE) and response surface (RS) schemes, ii) material modeling based on stochastic parameter identification and optimization, and iii) process pre-qualification by involving a stochastic robustness analysis.\",\"PeriodicalId\":152004,\"journal\":{\"name\":\"2010 11th International Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE)\",\"volume\":\"270 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-04-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 11th International Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESIME.2010.5464571\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 11th International Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESIME.2010.5464571","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Virtual prototyping advanced by statistic and stochastic methodologies
The paper reports three examples of best industrial practice showing the substantial benefits gained in terms of time-to-market reduction when virtual prototyping is enhanced by statistical and stochastic methodologies. These examples from a microelectronics setting of high volume component and module manufacturing deal with different fields: i) ball grid array (BGA) design optimization based on sophisticated design-of-experiments (DoE) and response surface (RS) schemes, ii) material modeling based on stochastic parameter identification and optimization, and iii) process pre-qualification by involving a stochastic robustness analysis.