基于统计和随机方法的虚拟样机技术

S. Rzepka, A. Muller, B. Michel
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引用次数: 5

摘要

本文报告了三个最佳工业实践的例子,展示了通过统计和随机方法增强虚拟原型时在缩短上市时间方面获得的实质性好处。这些例子来自于大量组件和模块制造的微电子设置,涉及不同的领域:i)基于复杂的实验设计(DoE)和响应面(RS)方案的球栅阵列(BGA)设计优化,ii)基于随机参数识别和优化的材料建模,以及iii)涉及随机鲁棒性分析的过程预审。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Virtual prototyping advanced by statistic and stochastic methodologies
The paper reports three examples of best industrial practice showing the substantial benefits gained in terms of time-to-market reduction when virtual prototyping is enhanced by statistical and stochastic methodologies. These examples from a microelectronics setting of high volume component and module manufacturing deal with different fields: i) ball grid array (BGA) design optimization based on sophisticated design-of-experiments (DoE) and response surface (RS) schemes, ii) material modeling based on stochastic parameter identification and optimization, and iii) process pre-qualification by involving a stochastic robustness analysis.
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