{"title":"专题讨论:安全设计是新的DFT吗?","authors":"R. Aitken","doi":"10.1109/VTS.2015.7116299","DOIUrl":null,"url":null,"abstract":"There has been a lot of interest recently in design-for-security, while at the same time research opportunities in conventional DFT are waning. Is DFS the new DFT, since many similar techniques can be applied, or is DFS something new, requiring new approaches to be successful, or is DFS merely a distraction? The panel will discuss the issues and give the audience the opportunity to decide.","PeriodicalId":187545,"journal":{"name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","volume":"141 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Panel: Is design-for-security the new DFT?\",\"authors\":\"R. Aitken\",\"doi\":\"10.1109/VTS.2015.7116299\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"There has been a lot of interest recently in design-for-security, while at the same time research opportunities in conventional DFT are waning. Is DFS the new DFT, since many similar techniques can be applied, or is DFS something new, requiring new approaches to be successful, or is DFS merely a distraction? The panel will discuss the issues and give the audience the opportunity to decide.\",\"PeriodicalId\":187545,\"journal\":{\"name\":\"2015 IEEE 33rd VLSI Test Symposium (VTS)\",\"volume\":\"141 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-04-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 33rd VLSI Test Symposium (VTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTS.2015.7116299\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 33rd VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2015.7116299","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
There has been a lot of interest recently in design-for-security, while at the same time research opportunities in conventional DFT are waning. Is DFS the new DFT, since many similar techniques can be applied, or is DFS something new, requiring new approaches to be successful, or is DFS merely a distraction? The panel will discuss the issues and give the audience the opportunity to decide.