{"title":"基于广义解耦多项式混沌的统计分析","authors":"Xiaochen Liu, E. Gad","doi":"10.1109/EPEPS.2015.7347120","DOIUrl":null,"url":null,"abstract":"This paper describes a new approach to the statistical characterization of high-speed interconnect circuits. The proposed approach is based on the idea of polynomial chaos and works by decoupling the matrices that arise from the Galerkin projection. The new approach is general in the sense that it can handle any polynomial system used in the generalized polynomial chaos(gPC) framework.","PeriodicalId":130864,"journal":{"name":"2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS)","volume":"115 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Statistical analysis via generalized decoupled polynomial chaos\",\"authors\":\"Xiaochen Liu, E. Gad\",\"doi\":\"10.1109/EPEPS.2015.7347120\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a new approach to the statistical characterization of high-speed interconnect circuits. The proposed approach is based on the idea of polynomial chaos and works by decoupling the matrices that arise from the Galerkin projection. The new approach is general in the sense that it can handle any polynomial system used in the generalized polynomial chaos(gPC) framework.\",\"PeriodicalId\":130864,\"journal\":{\"name\":\"2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"volume\":\"115 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2015.7347120\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2015.7347120","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Statistical analysis via generalized decoupled polynomial chaos
This paper describes a new approach to the statistical characterization of high-speed interconnect circuits. The proposed approach is based on the idea of polynomial chaos and works by decoupling the matrices that arise from the Galerkin projection. The new approach is general in the sense that it can handle any polynomial system used in the generalized polynomial chaos(gPC) framework.