汽车MOSFET晶体管的电-热-机械仿真

H. Feral, X. Chauffleur, J. Fradin
{"title":"汽车MOSFET晶体管的电-热-机械仿真","authors":"H. Feral, X. Chauffleur, J. Fradin","doi":"10.1109/ESIME.2010.5464597","DOIUrl":null,"url":null,"abstract":"Today, the reliability forecast is a new challenge for the electronic packaging industry. This paper deals with a 3 dimensional electro-thermo-mechanical modeling method for reliability studies of MOSFET transistor. This modeling method increases the accuracy of the thermomechanical computation. The dissipated power mission profile is computed with an electro-thermal co-simulation. The link between chip temperature and dissipated power is modeled for power electronics diodes and MOSFET. Specific MOSFET and diodes temperature dependent models are developed. Modeling method is developed around EPSILON-R3D thermal modeling tool. MODELICA and OpenModelica are used for electric computations. Temperature field is used for the thermo-mechanical study with ANSYS.","PeriodicalId":152004,"journal":{"name":"2010 11th International Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE)","volume":"190 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Electro-thermo-mechanical simulation of automotive MOSFET transistor\",\"authors\":\"H. Feral, X. Chauffleur, J. Fradin\",\"doi\":\"10.1109/ESIME.2010.5464597\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Today, the reliability forecast is a new challenge for the electronic packaging industry. This paper deals with a 3 dimensional electro-thermo-mechanical modeling method for reliability studies of MOSFET transistor. This modeling method increases the accuracy of the thermomechanical computation. The dissipated power mission profile is computed with an electro-thermal co-simulation. The link between chip temperature and dissipated power is modeled for power electronics diodes and MOSFET. Specific MOSFET and diodes temperature dependent models are developed. Modeling method is developed around EPSILON-R3D thermal modeling tool. MODELICA and OpenModelica are used for electric computations. Temperature field is used for the thermo-mechanical study with ANSYS.\",\"PeriodicalId\":152004,\"journal\":{\"name\":\"2010 11th International Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE)\",\"volume\":\"190 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-04-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 11th International Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESIME.2010.5464597\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 11th International Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESIME.2010.5464597","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

如今,可靠性预测是电子封装行业面临的新挑战。本文讨论了一种用于MOSFET晶体管可靠性研究的三维电-热-机械建模方法。这种建模方法提高了热力学计算的精度。利用电热联合仿真计算了耗散功率任务剖面。芯片温度和耗散功率之间的联系被建模为电力电子二极管和MOSFET。开发了特定的MOSFET和二极管温度依赖模型。围绕EPSILON-R3D热建模工具开发建模方法。使用MODELICA和OpenModelica进行电计算。采用ANSYS软件对温度场进行了热力学研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electro-thermo-mechanical simulation of automotive MOSFET transistor
Today, the reliability forecast is a new challenge for the electronic packaging industry. This paper deals with a 3 dimensional electro-thermo-mechanical modeling method for reliability studies of MOSFET transistor. This modeling method increases the accuracy of the thermomechanical computation. The dissipated power mission profile is computed with an electro-thermal co-simulation. The link between chip temperature and dissipated power is modeled for power electronics diodes and MOSFET. Specific MOSFET and diodes temperature dependent models are developed. Modeling method is developed around EPSILON-R3D thermal modeling tool. MODELICA and OpenModelica are used for electric computations. Temperature field is used for the thermo-mechanical study with ANSYS.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信