用于诊断片外电力输送的片上波形捕获器

K. Yoshikawa, T. Hashida, M. Nagata
{"title":"用于诊断片外电力输送的片上波形捕获器","authors":"K. Yoshikawa, T. Hashida, M. Nagata","doi":"10.1109/ICICDT.2011.5783194","DOIUrl":null,"url":null,"abstract":"In-place diagnosis of off-chip power delivery resonance is demonstrated with on-chip waveform capturer and power delivery network (PDN) exciter that were prototyped in a 65 nm CMOS technology. Oscillatory waveforms are captured after the excitation of PDN, from which an LCR lumped equivalent circuit of PDN seen by on-chip circuits is algorithmically derived. The consistency of component values is confirmed among the demonstrated in-place diagnosis and full-wave analysis.","PeriodicalId":402000,"journal":{"name":"2011 IEEE International Conference on IC Design & Technology","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"An on-chip waveform capturer for diagnosing off-chip power delivery\",\"authors\":\"K. Yoshikawa, T. Hashida, M. Nagata\",\"doi\":\"10.1109/ICICDT.2011.5783194\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In-place diagnosis of off-chip power delivery resonance is demonstrated with on-chip waveform capturer and power delivery network (PDN) exciter that were prototyped in a 65 nm CMOS technology. Oscillatory waveforms are captured after the excitation of PDN, from which an LCR lumped equivalent circuit of PDN seen by on-chip circuits is algorithmically derived. The consistency of component values is confirmed among the demonstrated in-place diagnosis and full-wave analysis.\",\"PeriodicalId\":402000,\"journal\":{\"name\":\"2011 IEEE International Conference on IC Design & Technology\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-05-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE International Conference on IC Design & Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICICDT.2011.5783194\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Conference on IC Design & Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICDT.2011.5783194","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

利用基于65纳米CMOS技术的片上波形捕获器和PDN励磁器对片外功率传递共振进行了现场诊断。在PDN激发后捕获振荡波形,通过算法推导出片上电路所见的PDN的LCR集总等效电路。验证了现场诊断与全波分析中各分量值的一致性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An on-chip waveform capturer for diagnosing off-chip power delivery
In-place diagnosis of off-chip power delivery resonance is demonstrated with on-chip waveform capturer and power delivery network (PDN) exciter that were prototyped in a 65 nm CMOS technology. Oscillatory waveforms are captured after the excitation of PDN, from which an LCR lumped equivalent circuit of PDN seen by on-chip circuits is algorithmically derived. The consistency of component values is confirmed among the demonstrated in-place diagnosis and full-wave analysis.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信