{"title":"用于诊断片外电力输送的片上波形捕获器","authors":"K. Yoshikawa, T. Hashida, M. Nagata","doi":"10.1109/ICICDT.2011.5783194","DOIUrl":null,"url":null,"abstract":"In-place diagnosis of off-chip power delivery resonance is demonstrated with on-chip waveform capturer and power delivery network (PDN) exciter that were prototyped in a 65 nm CMOS technology. Oscillatory waveforms are captured after the excitation of PDN, from which an LCR lumped equivalent circuit of PDN seen by on-chip circuits is algorithmically derived. The consistency of component values is confirmed among the demonstrated in-place diagnosis and full-wave analysis.","PeriodicalId":402000,"journal":{"name":"2011 IEEE International Conference on IC Design & Technology","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"An on-chip waveform capturer for diagnosing off-chip power delivery\",\"authors\":\"K. Yoshikawa, T. Hashida, M. Nagata\",\"doi\":\"10.1109/ICICDT.2011.5783194\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In-place diagnosis of off-chip power delivery resonance is demonstrated with on-chip waveform capturer and power delivery network (PDN) exciter that were prototyped in a 65 nm CMOS technology. Oscillatory waveforms are captured after the excitation of PDN, from which an LCR lumped equivalent circuit of PDN seen by on-chip circuits is algorithmically derived. The consistency of component values is confirmed among the demonstrated in-place diagnosis and full-wave analysis.\",\"PeriodicalId\":402000,\"journal\":{\"name\":\"2011 IEEE International Conference on IC Design & Technology\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-05-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE International Conference on IC Design & Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICICDT.2011.5783194\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Conference on IC Design & Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICDT.2011.5783194","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An on-chip waveform capturer for diagnosing off-chip power delivery
In-place diagnosis of off-chip power delivery resonance is demonstrated with on-chip waveform capturer and power delivery network (PDN) exciter that were prototyped in a 65 nm CMOS technology. Oscillatory waveforms are captured after the excitation of PDN, from which an LCR lumped equivalent circuit of PDN seen by on-chip circuits is algorithmically derived. The consistency of component values is confirmed among the demonstrated in-place diagnosis and full-wave analysis.