D. Girou, B. Landgraf, Ramses Guenther, M. Collon, M. Beijersbergen
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Bond strength of 3D-stacked monocrystalline silicon X-ray mirrors
This paper investigates the bond strength of flat directly-bonded structured monocrystalline silicon X-ray mirrors. We report on the sample manufacturing method and tensile strength testing measurements used to study the influence of annealing.