{"title":"CMOS和ECL多芯片封装中潜在的芯片- mcm衬底互连方法的相对优点图","authors":"U. Shrivastava, W. Valentine, M. Mahalingam","doi":"10.1109/ECTC.1992.204281","DOIUrl":null,"url":null,"abstract":"Results of a comparative study of the performance of 45 simultaneously switching 8-mA CMOS off chip drivers per chip and of 140 emitter follower drivers per ECL (emitter coupled logic) chip in various multichip module (MCM) scenarios are reported. The analysis was made for multichip systems using 12.7-mm*12.7-mm ICs. High-density substrate technology is essential for realizing the performance levels reported. Up to twelvefold (sevenfold for ECL) improvement in performance over TAB (tape automated bonding) is possible with the flip chip technology in CMOS (ECL) systems. When the propagation delay in the critical path in the multichip system is dominated by the internal gates, the speed figure of merit approaches unity. Electrical parasitics of the chip to substrate interconnections induce undershoot in the switching signal, which reduces the noise margin. Interconnection length is a major factor in determining the performance and noise for multichip packaging. This analysis shows that the flip chip technology provides the highest multichip system.<<ETX>>","PeriodicalId":125270,"journal":{"name":"1992 Proceedings 42nd Electronic Components & Technology Conference","volume":"125 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Relative figures of merit for potential chip-to-MCM substrate interconnection methods for CMOS and ECL multichip packaging\",\"authors\":\"U. Shrivastava, W. Valentine, M. Mahalingam\",\"doi\":\"10.1109/ECTC.1992.204281\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Results of a comparative study of the performance of 45 simultaneously switching 8-mA CMOS off chip drivers per chip and of 140 emitter follower drivers per ECL (emitter coupled logic) chip in various multichip module (MCM) scenarios are reported. The analysis was made for multichip systems using 12.7-mm*12.7-mm ICs. High-density substrate technology is essential for realizing the performance levels reported. Up to twelvefold (sevenfold for ECL) improvement in performance over TAB (tape automated bonding) is possible with the flip chip technology in CMOS (ECL) systems. When the propagation delay in the critical path in the multichip system is dominated by the internal gates, the speed figure of merit approaches unity. Electrical parasitics of the chip to substrate interconnections induce undershoot in the switching signal, which reduces the noise margin. Interconnection length is a major factor in determining the performance and noise for multichip packaging. This analysis shows that the flip chip technology provides the highest multichip system.<<ETX>>\",\"PeriodicalId\":125270,\"journal\":{\"name\":\"1992 Proceedings 42nd Electronic Components & Technology Conference\",\"volume\":\"125 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-05-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1992 Proceedings 42nd Electronic Components & Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.1992.204281\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1992 Proceedings 42nd Electronic Components & Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1992.204281","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
本文报道了在各种多芯片模块(MCM)场景下,每个芯片45个同时开关8ma CMOS离片驱动器和每个ECL(发射器耦合逻辑)芯片140个发射器跟随器驱动器的性能比较研究结果。对采用12.7 mm*12.7 mm ic的多芯片系统进行了分析。高密度衬底技术对于实现所报道的性能水平至关重要。在CMOS (ECL)系统中的倒装芯片技术可以使性能比TAB(磁带自动粘合)提高12倍(ECL为7倍)。在多芯片系统中,当关键路径上的传播延迟由内部门控制时,速度优值趋于统一。芯片与衬底互连的电寄生会引起开关信号的欠冲,从而降低噪声裕度。互连长度是决定多芯片封装性能和噪声的主要因素。这一分析表明倒装芯片技术提供了最高的多芯片系统
Relative figures of merit for potential chip-to-MCM substrate interconnection methods for CMOS and ECL multichip packaging
Results of a comparative study of the performance of 45 simultaneously switching 8-mA CMOS off chip drivers per chip and of 140 emitter follower drivers per ECL (emitter coupled logic) chip in various multichip module (MCM) scenarios are reported. The analysis was made for multichip systems using 12.7-mm*12.7-mm ICs. High-density substrate technology is essential for realizing the performance levels reported. Up to twelvefold (sevenfold for ECL) improvement in performance over TAB (tape automated bonding) is possible with the flip chip technology in CMOS (ECL) systems. When the propagation delay in the critical path in the multichip system is dominated by the internal gates, the speed figure of merit approaches unity. Electrical parasitics of the chip to substrate interconnections induce undershoot in the switching signal, which reduces the noise margin. Interconnection length is a major factor in determining the performance and noise for multichip packaging. This analysis shows that the flip chip technology provides the highest multichip system.<>