利用信号波形分析进行卡故障检测的非鲁棒性试验:可行性和优点

Proceedings of 14th VLSI Test Symposium Pub Date : 1996-04-28 DOI:10.1109/VTEST.1996.510879

A. Chatterjee, Rathish Jayabharathi, P. Pant, J. Abraham

{"title":"利用信号波形分析进行卡故障检测的非鲁棒性试验:可行性和优点","authors":"A. Chatterjee, Rathish Jayabharathi, P. Pant, J. Abraham","doi":"10.1109/VTEST.1996.510879","DOIUrl":null,"url":null,"abstract":"In this paper we propose to use an output signal waveform analysis method called signal waveform integration for detection of stuck-at failures in combinational circuits. Non-robust tests are applied at-speed or faster to achieve high fault coverage, low test application time and detectability of redundant faults using directed random test generation techniques.","PeriodicalId":424579,"journal":{"name":"Proceedings of 14th VLSI Test Symposium","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Non-robust tests for stuck-fault detection using signal waveform analysis: feasibility and advantages\",\"authors\":\"A. Chatterjee, Rathish Jayabharathi, P. Pant, J. Abraham\",\"doi\":\"10.1109/VTEST.1996.510879\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we propose to use an output signal waveform analysis method called signal waveform integration for detection of stuck-at failures in combinational circuits. Non-robust tests are applied at-speed or faster to achieve high fault coverage, low test application time and detectability of redundant faults using directed random test generation techniques.\",\"PeriodicalId\":424579,\"journal\":{\"name\":\"Proceedings of 14th VLSI Test Symposium\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-04-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 14th VLSI Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1996.510879\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 14th VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1996.510879","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 10

摘要

在本文中，我们提出了一种称为信号波形积分的输出信号波形分析方法来检测组合电路中的卡滞故障。使用定向随机测试生成技术，以更快或更快的速度应用非鲁棒测试，以实现高故障覆盖率、低测试应用时间和冗余故障的可检测性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Non-robust tests for stuck-fault detection using signal waveform analysis: feasibility and advantages

In this paper we propose to use an output signal waveform analysis method called signal waveform integration for detection of stuck-at failures in combinational circuits. Non-robust tests are applied at-speed or faster to achieve high fault coverage, low test application time and detectability of redundant faults using directed random test generation techniques.

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Proceedings of 14th VLSI Test Symposium

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