{"title":"Alpha AXP 21164微处理器的可测试性策略","authors":"D. Bhavsar, J. Edmondson","doi":"10.1109/TEST.1994.527935","DOIUrl":null,"url":null,"abstract":"This paper describes the testability strategy and design-for-test features of the Alpha AXP 21164 microprocessor. It discusses the specific testability and manufacturability issues of the chip and the innovative solutions employed to solve them.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"337 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"31","resultStr":"{\"title\":\"Testability strategy of the Alpha AXP 21164 microprocessor\",\"authors\":\"D. Bhavsar, J. Edmondson\",\"doi\":\"10.1109/TEST.1994.527935\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the testability strategy and design-for-test features of the Alpha AXP 21164 microprocessor. It discusses the specific testability and manufacturability issues of the chip and the innovative solutions employed to solve them.\",\"PeriodicalId\":309921,\"journal\":{\"name\":\"Proceedings., International Test Conference\",\"volume\":\"337 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"31\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1994.527935\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.527935","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Testability strategy of the Alpha AXP 21164 microprocessor
This paper describes the testability strategy and design-for-test features of the Alpha AXP 21164 microprocessor. It discusses the specific testability and manufacturability issues of the chip and the innovative solutions employed to solve them.