{"title":"在可变形的微通道流中传输","authors":"W. Chu, Jingyun Fang","doi":"10.1117/12.425329","DOIUrl":null,"url":null,"abstract":"Investigation of the entrainment of fluids induced by a wavy deformation along walls in a confined falt-plane microchannel is conducted by using the relaxed Navier-Stokes model with velocity- slip boundary conditions. Both no-slip and slip flow cases are presented with the former ones matched with the previous results. Flow patterns tuned by critical reflux values a0 and Reynolds number are demonstrated especially for the free pumping case. a0 decreases due to slip-flow effects after we compared them with no-slip cases.","PeriodicalId":429610,"journal":{"name":"Microelectronic and MEMS Technologies","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-04-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Transport in a deformable microchannel flow\",\"authors\":\"W. Chu, Jingyun Fang\",\"doi\":\"10.1117/12.425329\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Investigation of the entrainment of fluids induced by a wavy deformation along walls in a confined falt-plane microchannel is conducted by using the relaxed Navier-Stokes model with velocity- slip boundary conditions. Both no-slip and slip flow cases are presented with the former ones matched with the previous results. Flow patterns tuned by critical reflux values a0 and Reynolds number are demonstrated especially for the free pumping case. a0 decreases due to slip-flow effects after we compared them with no-slip cases.\",\"PeriodicalId\":429610,\"journal\":{\"name\":\"Microelectronic and MEMS Technologies\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-04-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronic and MEMS Technologies\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.425329\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronic and MEMS Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.425329","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation of the entrainment of fluids induced by a wavy deformation along walls in a confined falt-plane microchannel is conducted by using the relaxed Navier-Stokes model with velocity- slip boundary conditions. Both no-slip and slip flow cases are presented with the former ones matched with the previous results. Flow patterns tuned by critical reflux values a0 and Reynolds number are demonstrated especially for the free pumping case. a0 decreases due to slip-flow effects after we compared them with no-slip cases.