一种序列冗余故障识别方法及其在测试生成中的应用

Proceedings of IEEE 3rd Asian Test Symposium (ATS) Pub Date : 1994-11-15 DOI:10.1109/ATS.1994.367253

Hsing-Chung Liang, Chung-Len Lee, J. Chen

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引用次数: 6

摘要

提出了一种有效的序列冗余故障识别方法。该方法是基于一个简单的程序来识别不能初始化的触发器和不能控制到确定值的电路线路。将冗余故障分为四种类型，该方法可以识别出每一种类型的冗余故障。该方法已在实验中应用

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A sequential redundant fault identification scheme and its application to test generation

This work presents an efficient method to identify sequential redundant faults. The method is based on a simple procedure to identify the flip-flops which cannot be initialized and the circuit lines which cannot be controlled to definite values. The redundant faults are classified into four types and the method can identify each type of them. The method has been experimentally incorporated

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Proceedings of IEEE 3rd Asian Test Symposium (ATS)

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