Y. S. Cao, L. J. Jiang, A. Ruehli, J. Fan, J. Drewniak
{"title":"对互连问题中的辐射机制有了新的详细认识","authors":"Y. S. Cao, L. J. Jiang, A. Ruehli, J. Fan, J. Drewniak","doi":"10.1109/EPEPS.2016.7835454","DOIUrl":null,"url":null,"abstract":"Electromagnetic radiations from parasitic structures such as electronic interconnections are very difficult to diagnose because the ability to identify the specific sources are missing. Mainly, the source of radiations cannot be identified separately. Here, the partial element equivalent circuit (PEEC) method is extended to diagnose the radiation and its distribution. For the first time we identify the individual sources of radiation and the equivalence circuits for the sources. The proposed approach can be applied to find the radiation for electromagnetic interference (EMI) from a wide variety of structures.","PeriodicalId":241629,"journal":{"name":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"New detailed understanding of the mechanism of radiation in interconnect problems\",\"authors\":\"Y. S. Cao, L. J. Jiang, A. Ruehli, J. Fan, J. Drewniak\",\"doi\":\"10.1109/EPEPS.2016.7835454\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electromagnetic radiations from parasitic structures such as electronic interconnections are very difficult to diagnose because the ability to identify the specific sources are missing. Mainly, the source of radiations cannot be identified separately. Here, the partial element equivalent circuit (PEEC) method is extended to diagnose the radiation and its distribution. For the first time we identify the individual sources of radiation and the equivalence circuits for the sources. The proposed approach can be applied to find the radiation for electromagnetic interference (EMI) from a wide variety of structures.\",\"PeriodicalId\":241629,\"journal\":{\"name\":\"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2016.7835454\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2016.7835454","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New detailed understanding of the mechanism of radiation in interconnect problems
Electromagnetic radiations from parasitic structures such as electronic interconnections are very difficult to diagnose because the ability to identify the specific sources are missing. Mainly, the source of radiations cannot be identified separately. Here, the partial element equivalent circuit (PEEC) method is extended to diagnose the radiation and its distribution. For the first time we identify the individual sources of radiation and the equivalence circuits for the sources. The proposed approach can be applied to find the radiation for electromagnetic interference (EMI) from a wide variety of structures.