故障诊断中崩溃方法的评价

7th International Symposium on Quality Electronic Design (ISQED'06) Pub Date : 2006-03-27 DOI:10.1109/ISQED.2006.62

R. Adapa, S. Tragoudas, M. Michael

{"title":"故障诊断中崩溃方法的评价","authors":"R. Adapa, S. Tragoudas, M. Michael","doi":"10.1109/ISQED.2006.62","DOIUrl":null,"url":null,"abstract":"This paper presents two new single stuck-at fault collapsing methods to reduce the number of tests required for fault diagnosis. The impact of the proposed collapsing methods on diagnosis is evaluated in terms of time and space requirements for the diagnosis process. Experimental comparisons on the ISCAS'85 benchmarks demonstrate the impact of the proposed generalization over the traditional fault collapsing method","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Evaluation of collapsing methods for fault diagnosis\",\"authors\":\"R. Adapa, S. Tragoudas, M. Michael\",\"doi\":\"10.1109/ISQED.2006.62\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents two new single stuck-at fault collapsing methods to reduce the number of tests required for fault diagnosis. The impact of the proposed collapsing methods on diagnosis is evaluated in terms of time and space requirements for the diagnosis process. Experimental comparisons on the ISCAS'85 benchmarks demonstrate the impact of the proposed generalization over the traditional fault collapsing method\",\"PeriodicalId\":138839,\"journal\":{\"name\":\"7th International Symposium on Quality Electronic Design (ISQED'06)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-03-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"7th International Symposium on Quality Electronic Design (ISQED'06)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2006.62\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"7th International Symposium on Quality Electronic Design (ISQED'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2006.62","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 4

摘要

为了减少故障诊断所需的测试次数，本文提出了两种新的单卡故障折叠方法。从诊断过程的时间和空间要求两方面评价了所提出的崩溃方法对诊断的影响。在ISCAS'85基准上的实验比较表明，所提出的概化方法对传统断层崩塌方法的影响

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Evaluation of collapsing methods for fault diagnosis

This paper presents two new single stuck-at fault collapsing methods to reduce the number of tests required for fault diagnosis. The impact of the proposed collapsing methods on diagnosis is evaluated in terms of time and space requirements for the diagnosis process. Experimental comparisons on the ISCAS'85 benchmarks demonstrate the impact of the proposed generalization over the traditional fault collapsing method

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

7th International Symposium on Quality Electronic Design (ISQED'06)

自引率

0.00%

发文量